Shared facilities

The shared ressource laboratories provides a highly qualified personnel and sophisticated instrumentation to researchers or enterprises interested in RF circuit characterization, device modeling and on-wafer characterization. Click here for a general presentation.
We can do:

On-wafer measurements
Noise measurements
S- and X- parameters measurements
IxV measurements

Lab includes:

Measurement bench
SUSS EP6 manual, 150mm wafer probe station (50 GHz capabalities)
DC-2.65GHz very low noise signal analyzer
Faraday cage
13.5 GHz, 4 ports, nonlinear VNA (PNA-X)
IxV tracer, 2 channels, DC / pulsed

Everbeing C-4 Manual wafer probe station

2 GSGSG 125 µm probes
2 bias tees (.045-26 GHz)
Calibration substrate and connections up to 67 GHz

Here are some of the possible probing configurations:

signal_analyzer

Signal analyzers

DC – 10 MHz
2 MHz – 2.65 GHz
10 MHz – 13 GHz

nf-sa-421f5

LF low noise differential amplifier

16 Hz – 40 MHz

noise_source

Keysight 346A noise source

10 MHz – 18 GHz
for LNA characterization

These equipments are available for:

LF (< 10MHz) noise measurements
- Flicker (1/f) noise measurements: quality of the cristaline structure; noise modeling in transistors
- Noise floor: 0.5 nV/√Hz @ 100 KHz
Phase noise measurements (<13 GHz):
- PM demodulation or spectrum measurement.
- Noise floors: -97 dBc@1 kHz; -120 dBc@10 kHz, -120 dBc@100 kHz; -132dBc@1 MHz; -146 dBc@1 MHz
Noise figure measurements (<13 GHz):
- NF as low as 1 dB!!