Shared facilities

The shared ressource laboratories provides a highly qualified personnel and sophisticated instrumentation to researchers or enterprises interested in RF circuit characterization, device modeling and on-wafer characterization. Click here for a general presentation.
We can do:

Lab includes:

 



ep6

 

Suss EP6 Manual wafer probe station

  • 2 GSG 125 µm probes
  • 2 DC probes
  • 2 bias tees (.045-26 GHz)
  • Calibration substrate and connections up to 50 GHz
  • 2 GSGSG 125 µm probes being purchased

Here are some of the possible probing configurations:

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signal_analyzer

Signal analyzers

  • DC – 10 MHz
  • 2 MHz – 2.65 GHz
  • 10 MHz – 13 GHz

nf-sa-421f5

 

LF low noise differential amplifier

  • 16 Hz – 40 MHz

noise_source

Keysight 346A noise source

  • 10 MHz – 18 GHz
  • for LNA characterization

These equipments are available for:

  • LF (< 10MHz) noise measurements
    • Flicker (1/f) noise measurements: quality of the cristaline structure; noise modeling in transistors
    • Noise floor: 0.5 nV/√Hz @ 100 KHz
  • Phase noise measurements (<13 GHz):
    • PM demodulation or spectrum measurement.
    • Noise floors: -97 dBc@1 kHz; -120 dBc@10 kHz, -120 dBc@100 kHz;  -132dBc@1 MHz;  -146 dBc@1 MHz
  • Noise figure measurements (<13 GHz):
    • NF as low as 1 dB!!

Measurements done so far:

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pna-x

 

PNA-X 13.5 GHz 4-ports

(to the best of our knowledge, the 1st of its kind in Brazil)

Available for 4-ports linear and nonlinear characterization:

  • Transformers
  • Differential amplifiers
  • Power amplifiers
  • Duplexers
  • Multiple antena network

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ixv

 

IxV tracer, 2 channels, DC/ pulsed

Available for 1- and 2-ports I x V characterization (DC and pulsed):

  • 10-13 A < CURRENT < 10-1 A
  • 10-6 V < VOLTAGE < 102 V

To be soon available: temperature controlled measurements!